Joint Test Action Group

Results: 911



#Item
691Boundary scan / Joint Test Action Group / Electronics manufacturing / IEEE standards / Technology

Semantic Rules, ABSDL (IEEE[removed]syntax rules for BSDL apply (as defined in IEEE Std[removed]Annex B, specifically section B.8) - semantic rules for BSDL apply (as defined in IEEE Std[removed]Annex B, specificall

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Source URL: grouper.ieee.org

Language: English - Date: 2006-06-13 11:22:15
692Manufacturing / D-3 / Electronic engineering / Electronics manufacturing / Electronics / Joint Test Action Group

-- [removed]MST Kitchen Sink version 3_0 -- BSDL description of an example[removed]device -- This is an[removed]compatible BSDL that encodes[removed]features.

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Source URL: grouper.ieee.org

Language: English - Date: 2007-01-30 09:15:14
693Electronics manufacturing / Electronic design / Integrated circuits / Automatic test pattern generation / Test compression / Scan chain / Joint Test Action Group / Boundary scan / Physical design / Electronic engineering / Electronics / Electronic design automation

Datasheet DFTMAX High Quality, Low Cost Test Overview

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Source URL: www.synopsys.com

Language: English - Date: 2015-03-20 14:15:36
694Integrated circuits / Automatic test pattern generation / Electronics manufacturing / Electronic design / Test compression / Scan chain / Iddq testing / Joint Test Action Group / Synopsys / Electronic engineering / Electronics / Electronic design automation

Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview

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Source URL: www.synopsys.com

Language: English - Date: 2015-02-18 14:15:52
695Synopsys / Field-programmable gate array / Cray / Joint Test Action Group / Application-specific integrated circuit / Xilinx / FPGA prototype / Hardware emulation / Electronic engineering / Electronics / Hillsboro /  Oregon

Success Story Synopsys and Cray FPGA-Based Prototyping System Enables Robust Testing and Early Software Development for Network Interface ASIC Design

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Source URL: www.synopsys.com

Language: English
696Software licenses / MS Rigel / Rigel / Macintosh / Software / Demon Princes / Free software / Joint Test Action Group / Serial port / Computing / Electronics / Technology

Rita-51 USER’S GUIDE Version 1.0 May[removed]RIGEL CORPORATION

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Source URL: www.rigelcorp.com

Language: English - Date: 2006-07-13 13:47:30
697Manufacturing / Joint Test Action Group / Boundary scan / Scan chain / Test compression / Automatic test pattern generation / Block cipher / Man-in-the-middle attack / Side channel attack / Electronic engineering / Electronics / Electronics manufacturing

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING Received 30 April 2013; revised 6 October 2013; accepted 22 December[removed]Date of publication 5 February 2014; date of current version 7 May 2014.

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Source URL: www.computer.org

Language: English - Date: 2014-06-16 15:59:17
698ARM architecture / Acorn Computers / Instruction set architectures / Electronics manufacturing / Joint Test Action Group / System on a chip / Synopsys / Field-programmable gate array / Embedded system / Electronic engineering / Computer architecture / Electronics

Success Story ZeBu Success Story CSR Image Processing With ZeBu we achieved a win-win situation: not just faster time-to‑market

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Source URL: www.synopsys.com

Language: English - Date: 2014-11-07 14:38:04
699Computer buses / Audio engineering / SLIMbus / Digital audio / General Purpose Input/Output / Joint Test Action Group / TRS connector / Feedback / Mixing console / Electronics / Electronic engineering / Computer hardware

w WM5102 Audio Hub CODEC with Voice Processor DSP DESCRIPTION

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Source URL: www.wolfsonmicro.com

Language: English - Date: 2014-02-17 12:22:36
700Electronic engineering / Embedded systems / Instruction set architectures / Central processing unit / Joint Test Action Group / Serial Peripheral Interface Bus / Conventional PCI / Universal Serial Bus / I²C / Computer hardware / Microcontrollers / Electronics

Features • High Performance, Low Power AVR® 8-Bit Microcontroller • Advanced RISC Architecture •

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Source URL: www.atmel.com

Language: English - Date: 2014-01-09 14:43:50
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